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News
Chip Industry Week in Review
3+ day, 42+ min ago (454+ words) 12-inch high-NA EUV masks; Arm’s edge AI push; Amkor’s expansion; 3D memory; FeRAM startup makes waves; Qualcomm-AWS $60B custom silicon deal; Ayar Labs’ scale-up deal; new iPhone chip and format; rogue OpenAI agents in Germany; fab factory; fine-pitch RDL tech for advanced…...
Redefining Processes At Sub-2nm
4+ day, 9+ hour ago (591+ words) Discrete steps are being merged with others as dimensions shrink into the angstrom range. The lines between discrete semiconductor manufacturing processes are starting to blur at sub-2nm nodes as transistors continue to shrink, sensitivity to various processes rises, and the…...
Beyond Conventional Ring Oscillators: Purpose-Built Process Detectors For Deeper Silicon Insight
4+ day, 9+ hour ago (473+ words) By Guy Cortez, Dan Alexandrescu, and Aaron Barker The semiconductor industry has invested heavily in embedded monitors to gain visibility into advanced silicon. Those monitors are essential, but the next step is not simply to collect a larger volume of…...
Chip Industry Technical Paper Roundup: Sept. 8
6+ day, 9+ hour ago (109+ words) HBF for LLM inference; M3D SRAM with BEOL pass-gates at 2nm; distributed GPU architectures; hybrid HBM-HBF memory; GaN-on-silicon polarization superjunctions; programmable silicon photonics; Al dopant activation in 4H-SiC. The post Chip Industry Technical Paper Roundup: Sept. 8 appeared first on Semiconductor Engineering. Chip…...
Multi-Die Design for Automotive Applications
1+ week, 5+ day ago (178+ words) Multi-die design is becoming indispensable for automotive applications, such as ADAS and IVI, addressing demands for reliability and safety. The post Multi-Die Design for Automotive Applications appeared first on Semiconductor Engineering. Electronics for automobiles sit in the middle of two…...
Chip Industry Technical Paper Roundup: Sep. 1
1+ week, 6+ day ago (98+ words) Semiconductor Engineering Chip Industry Technical Paper Roundup: Sep. 1 Wafer-scale optical interconnects for LLM training; Rowhammer-based inference attacks; 3D-IC test cases; liquid cooling for 2.5D/3D packages; wafer-scale 2D semi growth; DL-based parameter extraction for 2D transistors; and chip-placement optimization. New technical papers recently added…...
Advancing The CFET-Based Device Roadmap: Novel Integration Modules And Standard Cell Configurations
1+ week, 6+ day ago (815+ words) Part I – Pioneering work in developing CFET-critical modules: an improved backside contact module and a novel gate stack for threshold voltage tuning. By Cassie Sheng, Hiroaki Arimura, and Naoto Horiguchi The semiconductor industry is going through a major architectural transition,…...
Multi-Die Assemblies Dominate At 2nm And Below
3+ week, 9+ hour ago (997+ words) Chips are getting bigger, more modular, and much more capable as new innovations mix with existing processes and long-researched projects go mainstream. Multi-die assemblies and heterogeneous integration are becoming standard in leading-edge servers and high-end edge devices, forcing broad changes…...
Managing Thermal Expansion And Electromigration Through Interposer Design
3+ week, 4+ day ago (299+ words) New deep learning models may provide a pathway for modeling warpage. As scaling transistors laterally becomes more difficult, manufacturers are turning to vertical transistor designs such as CFETs and vertical packaging to increase device density. At the same time, the…...
Three Strategic Imperatives For Energy-Efficient AI Computing
3+ week, 4+ day ago (495+ words) Reducing energy consumption is key to both lowering inference cost and enabling emerging physical AI applications. The post Three Strategic Imperatives For Energy-Efficient AI Computing appeared first on Semiconductor Engineering. The headlines are dominated by the unprecedented growth in data…...